Abstract
Recent studies on few-shot classification using transfer learning pose challenges to the effectiveness and efficiency of episodic meta-learning algorithms. Transfer learning approaches are a natural alternative, but they are restricted to few-shot classification. Moreover, little attention has been on the development of probabilistic models with well-calibrated uncertainty from few-shot samples, except for some Bayesian episodic learning algorithms. To tackle the aforementioned issues, we propose a new transfer learning method to obtain accurate and reliable models for few-shot regression and classification. The resulting method does not require episodic meta-learning and is called meta-free representation learning (MFRL). MFRL first finds low-rank representation generalizing well on meta-test tasks. Given the learned representation, probabilistic linear models are fine-tuned with few-shot samples to obtain models with well-calibrated uncertainty. The proposed method not only achieves the highest accuracy on a wide range of few-shot learning benchmark datasets but also correctly quantifies the prediction uncertainty. In addition, weight averaging and temperature scaling are effective in improving the accuracy and reliability of few-shot learning in existing meta-learning algorithms with a wide range of learning paradigms and model architectures.
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URL
https://arxiv.org/abs/2204.12466
