Abstract
Segmentation models in automated optical inspection of wire-bonded semiconductors are typically device-specific and must be re-trained when new devices or distribution shifts appear. We introduce AOI-SSL, a training-efficient framework for semantic segmentation of wire-bonded semiconductors by combining small-domain self-supervised pre-training of vision transformers with in-context inference that minimizes the need of labeled examples. We pre-train SOTA self-supervised algorithms in a small industrial inspection dataset and find that Masked Autoencoders are the most effective in this small-data setting, improving downstream segmentation while reducing the labeled fine-tuning effort. We further introduce in-context, patch-level retrieval methods that predict masks directly from dense encoder embeddings with negligible additional training. We show that, in this setting, simple similarity-based retrieval performs on par with more complex attention-based aggregation used currently in the literature. Furthermore, our experiments demonstrate that self-supervised pre-training significantly improves segmentation quality compared to training from scratch and to ImageNet pre-trained backbones under a fixed fine-tuning computational budget. Finally, the results reveal that retrieval based segmentation outperforms fine-tuning when targeting single device images, allowing for near-instant adaptation to difficult samples.
Abstract (translated)
URL
https://arxiv.org/abs/2605.12430
