Abstract
Industrial visual inspection must both decide whether a product is defective and localize the defect, yet pixel-level masks are costly to collect at scale. Most anomaly-segmentation methods learn only from defect-free images and score deviations from normality. A true defect and an unusual-but-normal region, however, can both deviate substantially and receive similarly high scores. We propose Contrastive Dual Gaussian Processes (CDGP), a weakly supervised framework that models normal and anomaly inducing-variable predictive distributions over dense tokens. Its posterior-dominance statistic standardizes their predictive-mean difference by the joint predictive uncertainty, providing both spatial evidence and image-level confidence. This evidence complements hierarchical normal-reconstruction residuals for fine localization. All calibration uses training data only, without human pixel annotations or test-time fitting. Across MVTec AD~2, KSDD2, and VisA, CDGP ranks first among the evaluated methods on all MVTec AD~2 localization metrics and is first-place or competitive on KSDD2 and VisA. Factorized and matched linear-head controls delimit the contribution and scope of the linear-kernel Gaussian process (GP) formulation.
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URL
https://arxiv.org/abs/2608.18614
